Ultimate phase sensitivity in surface plasmon resonance sensors by tuning critical coupling with phase change materials
Résumé
Surface plasmon resonance phase interrogation is assumed to be more sensitive than intensity or wavelength interrogation. We propose for the first time theoretical and numerical studies of the phase in surface plasmon resonance sensor and establish a quantitative relation between phase sensitivity and wavelength interrogation. We reveal the link between ultra-high phase sensitivity and critical coupling condition. However, reaching this condition requires a technically infeasible angstrom-level precision in the metal layer thickness. We propose a robust solution to overcome this limitation by coupling the SPR with a phase-change material (PCM) thin film. By exploiting the multilevel reconfigurable phase states of PCM, we theoretically demonstrate ultra-high phase sensitivities with a limit of detection as low as 10(-10) refractive index unit (RIU). Such a PCM-assisted SPR sensor platform paves the way for unprecedented sensitivity sensors for the detection of trace amounts of low molecular weight species in biomedical sensing and environmental monitoring. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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