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Mots clés
7630Lh
AFM
SiC
Channeling
Sputtering
Stable isotopic tracing
Adsorption Isotherms
Oxidation
6855Jk
Pulsed laser deposition
Alloy
Ageing
Acoustic propreties of solid
Aluminum
Silicon carbide
Interface defects
Nanoparticles
Passivation
Magnetization curves
Ion implantation
Growth
Epitaxy
3C-SiC
Acoustic
Indium oxide
Epitaxial growth
Metal-insulator transition
PIXE
HfO2
Alloys
Capillary condensation
Measurement
Topological insulators
Oxygen deficiency
18O resonance
Silica
Evaluation
Adsorbed layers
27Alda
17Op
Multilayer
17Opp
Kossel diffraction
Energy loss
Auger electron spectroscopy AES
Low energy electron diffraction LEED
Ion beam analysis
Isotopic Tracing
ALD
Raman spectroscopy
17O
8140Ef
AC susceptibility
Ferromagnetic resonance
Transparent conductive oxide TCO
X-ray diffraction
Silicon
Defects
Nitridation
Nuclear reaction analysis
Zinc oxide
Gold
Charge exchange
Nuclear resonance profiling NRP
Topological defects
XPS
EPR
Thin film
Thin films
Diffusion
Aluminium
Photoluminescence
Magnetic semiconductors
NRP
Nanostructures
18O
Pb centers
GaMnAs
Periodic multilayer
ADSORPTION DESORPTION HYSTERESIS
Atomic Layer Deposition ALD
RBS
15N
7550Ee
Rutherford backscattering spectrometry RBS
Hysteresis
Density functional theory
Adsorption
Al2O3
Nickel
13C
27Aldp
Annealing
Silicon Carbide
XRD
27Ald p&α
2H
7550Pp
Gallium oxide
Magnetic anisotropy